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 1200V 30mΩ Gen2 Automotive SiC MOSFET
 1200V 30mΩ Gen2 Automotive SiC MOSFET

1200V 30mΩ Gen2 Automotive SiC MOSFET 日本

  • Introduction

Introduction
Place of Origin: Zhejiang
Brand Name: Inventchip Technology
Model Number: IV2Q12030D7Z
Certification: AEC-Q101 qualified


Features

  • 2 nd Generation SiC MOSFET Technology with+18V gate drive

  • High blocking voltage with low on-resistance

  • High speed switching with low capacitance

  • High operating junction temperature capability

  • Very fast and robust intrinsic body diode

  • Kelvin gate input easing driver circuit design

Applications

  • Motor drivers

  • Solar inverters

  • Automotive DC/DC converters

  • Automotive compressor inverters

  • Switch mode power supplies


Outline:

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Marking Diagram:

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Absolute Maximum Ratings(TC=25°C unless otherwise spec2ified)

Symbol Parameter Value Unit Test Conditions Note
VDS Drain-Source voltage 1200 V VGS =0V, ID =100μA
VGSmax (DC) Maximum DC voltage -5 to 20 V Static (DC)
VGSmax (Spike) Maximum spike voltage -10 to 23 V Duty cycle
VGSon Recommended turn-on voltage 18±0.5 V
VGSoff Recommended turn-off voltage -3.5 to -2 V
ID Drain current (continuous) 79 A VGS =18V, TC =25°C Fig. 23
58 A VGS =18V, TC =100°C
IDM Drain current (pulsed) 198 A Pulse width limited by SOA Fig. 26
PTOT Total power dissipation 395 W TC =25°C Fig. 24
Tstg Storage temperature range -55 to 175 °C
TJ Operating junctiontemperature -55 to 175 °C
TL Solder Temperature 260 °C wave soldering only allowed at leads, 1.6mm from case for 10 s


Thermal Data

Symbol Parameter Value Unit Note
Rθ(J-C) Thermal Resistance from Junction to Case 0.38 °C/W Fig. 23


Electrical Characteristics(TC =25。C unless otherwise specified)

Symbol Parameter Value Unit Test Conditions Note
Min. Typ. Max.
IDSS Zero gate voltage drain current 5 100 μA VDS =1200V, VGS =0V
IGSS Gate leakage current ±100 nA VDS =0V, VGS = -5~20V
VTH Gate threshold voltage 1.8 2.8 4.5 V VGS=VDS , ID =12mA Fig. 8, 9
2.0 VGS=VDS , ID =12mA @ TJ =175。C
RON Static drain-source on - resistance 30 39 VGS =18V, ID =30A @TJ =25。C Fig. 4, 5, 6, 7
55 VGS =18V, ID =30A @TJ =175。C
36 47 VGS =15V, ID =30A @TJ =25。C
58 VGS =15V, ID =30A @TJ =175。C
Ciss Input capacitance 3000 pF VDS=800V, VGS =0V,   f=1MHz, VAC=25mV Fig. 16
Coss Output capacitance 140 pF
Crss Reverse transfer capacitance 7.7 pF
Eoss Coss  stored energy 57 μJ Fig. 17
Qg Total gate charge 135 nC VDS =800V, ID =40A, VGS =-3 to 18V Fig. 18
Qgs Gate-source charge 36.8 nC
Qgd Gate-drain charge 45.3 nC
Rg Gate input resistance 2.3 Ω f=1MHz
EON Turn-on switching energy 856.6 μJ VDS =800V, ID =40A, VGS =-3.5 to 18V,    RG(ext) =3.3Ω, L=200μH TJ =25。C Fig. 19, 20
EOFF Turn-off switching energy 118.0 μJ
td(on) Turn-on delay time 15.4 ns
tr Rise time 24.6
td(off) Turn-off delay time 28.6
tf Fall time 13.6


Reverse Diode Characteristics(TC =25。C unless otherwise specified)

Symbol Parameter Value Unit Test Conditions Note
Min. Typ. Max.
VSD Diode forward voltage 4.2 V ISD =30A, VGS =0V Fig. 10, 11, 12
4.0 V ISD =30A, VGS =0V, TJ =175。C
trr Reverse recovery time 54.8 ns VGS=-3.5V/+18V, ISD =40A, VR =800V, RG(ext) =13Ω  L=200μH di/dt=3000A/μs
Qrr Reverse recovery charge 470.7 nC
IRRM Peak reverse recovery current 20.3 A


Typical Performance (curves)

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