Home / Products / SiC MOSFET
Place of Origin: |
Zhejiang |
Brand Name: |
Inventchip |
Model Number: |
IV2Q171R0D7 |
Minimum packing Quantity: |
450 |
Symbol |
Parameter |
Value |
Unit |
Test Conditions |
Note |
VDS |
Drain-Source voltage |
1700 |
V |
VGS=0V, ID=10μA |
|
VGSmax (Transient) |
Maximum spike voltage |
-10 to 23 |
V |
Duty cycle <1%, and pulse width<200ns |
|
VGSon |
Recommended turn-on voltage |
15 to 18 |
V |
|
|
VGSoff |
Recommended turn-off voltage |
-5 to -2 |
V |
Typical value -3.5V |
|
ID |
Drain current (continuous) |
6.3 |
A |
VGS=18V, TC=25°C |
Fig. 23 |
ID |
Drain current (continuous) |
4.8 |
A |
VGS=18V, TC=100°C |
Fig. 23 |
IDM |
Drain current (pulsed) |
15.7 |
A |
Pulse width limited by SOA and dynamic Rθ(J-C) |
Fig. 25, 26 |
ISM |
Body diode current (pulsed) |
15.7 |
A |
Pulse width limited by SOA and dynamic Rθ(J-C) |
Fig. 25, 26 |
PTOT |
Total power dissipation |
73 |
W |
TC=25°C |
Fig. 24 |
Tstg |
Storage temperature range |
-55 to 175 |
°C |
||
TJ |
Operating junction temperature |
-55 to 175 |
°C |
|
|
Symbol |
Parameter |
Value |
Unit |
Note |
Rθ(J-C) |
Thermal Resistance from Junction to Case |
2.05 |
°C/W |
Fig. 25 |
Symbol |
Parameter |
Value |
Unit |
Test Conditions |
Note |
||
Min. |
Typ. |
Max. |
|||||
IDSS |
Zero gate voltage drain current |
1 |
10 |
μA |
VDS=1700V, VGS=0V |
||
IGSS |
Gate leakage current |
±100 |
nA |
VDS=0V, VGS=-5~20V |
|||
VTH |
Gate threshold voltage |
1.8 |
3.0 |
4.5 |
V |
VGS=VDS, ID=380uA |
Fig. 8, 9 |
2.0 |
V |
VGS=VDS, ID=380uA @ TJ=175°C |
|||||
RON |
Static drain-source on resistance |
700 1280 |
910 |
mΩ |
VGS=18V, ID=1A @TJ=25°C @TJ=175°C |
Fig. 4, 5, 6, 7 |
|
950 1450 |
1250 |
mΩ |
VGS=15V, ID=1A @TJ=25°C @TJ=175°C |
||||
Ciss |
Input capacitance |
285 |
pF |
VDS=1000V, VGS=0V, f=1MHz, VAC=25mV |
Fig. 16 |
||
Coss |
Output capacitance |
15.3 |
pF |
||||
Crss |
Reverse transfer capacitance |
2.2 |
pF |
||||
Eoss |
Coss stored energy |
11 |
μJ |
Fig. 17 |
|||
Qg |
Total gate charge |
16.5 |
nC |
VDS=1000V, ID=1A, VGS=-5 to 18V |
Fig. 18 |
||
Qgs |
Gate-source charge |
2.7 |
nC |
||||
Qgd |
Gate-drain charge |
12.5 |
nC |
||||
Rg |
Gate input resistance |
13 |
Ω |
f=1MHz |
|||
EON |
Turn-on switching energy |
51.0 |
μJ |
VDS=1000V, ID=2A, VGS=-3.5V to 18V, RG(ext)=10Ω, L=2330μH Tj=25°C |
Fig. 19, 20 |
||
EOFF |
Turn-off switching energy |
17.0 |
μJ |
||||
td(on) |
Turn-on delay time |
4.8 |
ns |
||||
tr |
Rise time |
13.2 |
|||||
td(off) |
Turn-off delay time |
12.0 |
|||||
tf |
Fall time |
66.8 |
|||||
EON |
Turn-on switching energy |
90.3 |
μJ |
VDS=1000V, ID=2A, VGS=-3.5V to 18V, RG(ext)=10Ω, L=2330μH Tj=175°C |
Fig. 22 |
||
EOFF |
Turn-off switching energy |
22.0 |
μJ |
Symbol |
Parameter |
Value |
Unit |
Test Conditions |
Note |
||
Min. |
Typ. |
Max. |
|||||
VSD |
Diode forward voltage |
4.0 |
V |
ISD=1A, VGS=0V |
Fig. 10, 11, 12 |
||
3.8 |
V |
ISD=1A, VGS=0V, TJ=175°C |
|||||
IS |
Diode forward current (continuous) |
11.8 |
A |
VGS=-2V, TC=25°C |
|||
6.8 |
A |
VGS=-2V, TC=100°C |
|||||
trr |
Reverse recovery time |
20.6 |
ns |
VGS=-3.5V/+18V, ISD=2A, VR=1000V, RG(ext)=10Ω L=2330μH di/dt=5000A/μs |
|||
Qrr |
Reverse recovery charge |
54.2 |
nC |
||||
IRRM |
Peak reverse recovery current |
8.2 |
A |